Using Heavy-ion Fault Injection to Evaluate Fault Tolerance with respect to Cluster Size in a Time-triggered Communication System
Paper in proceeding, 2003
Author
Håkan Sivencrona
M. Persson
Jan Torin
Chalmers, Department of Computer Engineering
Published in
Proceedings of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS-6) April 2003, Poznan 2003
p. 171-176
83-7143-557-6 (ISBN)
Categorizing
Subject Categories (SSIF 2011)
Computer and Information Science
Identifiers
ISBN
83-7143-557-6