Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects
Journal article, 2013

This anthology contains contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The topics span from basic mechanisms for single-particle induced failures to applied tasks like developing websites to predict on-orbit single event failure rates using Monte Carlo radiation transport tools.

Monte Carlo radiation transport

single event effects

Author

R. A. Reed

Vanderbilt University

R. A. Weller

Vanderbilt University

A. Akkerman

Soreq Nuclear Research Center

J. Barak

Soreq Nuclear Research Center

W. Culpepper

NASA Johnson Space Center

S. Duzellier

ONERA Centre de Toulouse

C. Foster

NASA Johnson Space Center

M. Gaillardin

The French Alternative Energies and Atomic Energy Commission (CEA)

G. Hubert

ONERA Centre de Toulouse

T. Jordan

E.M.P. Consultants

I. Jun

Jet Propulsion Laboratory, California Institute of Technology

S. Koontz

NASA Johnson Space Center

F. Lei

RadMod Research Ltd.

P. McNulty

Clemson University

M. H. Mendenhall

Vanderbilt University

M. Murat

Soreq Nuclear Research Center

P. Nieminen

European Space Research and Technology Centre (ESA ESTEC)

P. O'Neill

NASA Johnson Space Center

M. Raine

The French Alternative Energies and Atomic Energy Commission (CEA)

B. Reddell

NASA Johnson Space Center

F. Saigne

University of Montpellier

G. Santin

Rhea System SA

European Space Research and Technology Centre (ESA ESTEC)

Lembit Sihver

Chalmers, Applied Physics, Nuclear Engineering

H. H. K. Tang

IBM Thomas J. Watson Research Center

P. R. Truscott

Kallisto Consultancy Ltd.

F. Wrobel

University of Montpellier

IEEE Transactions on Nuclear Science

0018-9499 (ISSN)

Vol. 60 3 1876-1911

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/tns.2013.2262101

More information

Latest update

8/23/2019