Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects
Journal article, 2013
This anthology contains contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The topics span from basic mechanisms for single-particle induced failures to applied tasks like developing websites to predict on-orbit single event failure rates using Monte Carlo radiation transport tools.
single event effects
Monte Carlo radiation transport
Author
R. A. Reed
Vanderbilt University
R. A. Weller
Vanderbilt University
A. Akkerman
Soreq Nuclear Research Center
J. Barak
Soreq Nuclear Research Center
W. Culpepper
National Aeronautics and Space Administration (NASA)
S. Duzellier
ONERA Centre de Toulouse
C. Foster
National Aeronautics and Space Administration (NASA)
M. Gaillardin
The French Alternative Energies and Atomic Energy Commission (CEA)
G. Hubert
ONERA Centre de Toulouse
T. Jordan
E.M.P. Consultants
I. Jun
California Institute of Technology (Caltech)
S. Koontz
National Aeronautics and Space Administration (NASA)
F. Lei
RadMod Research Ltd.
P. McNulty
Clemson University
M. H. Mendenhall
Vanderbilt University
M. Murat
Soreq Nuclear Research Center
P. Nieminen
European Space Agency (ESA)
P. O'Neill
National Aeronautics and Space Administration (NASA)
M. Raine
The French Alternative Energies and Atomic Energy Commission (CEA)
B. Reddell
National Aeronautics and Space Administration (NASA)
F. Saigne
University of Montpellier
G. Santin
European Space Agency (ESA)
Rhea Group
Lembit Sihver
Chalmers, Applied Physics, Nuclear Engineering
H. H. K. Tang
IBM Thomas J. Watson Research Center
P. R. Truscott
Kallisto Consultancy Ltd.
F. Wrobel
University of Montpellier
IEEE Transactions on Nuclear Science
0018-9499 (ISSN)
Vol. 60 3 1876-1911 6530734Subject Categories (SSIF 2011)
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/tns.2013.2262101