Cluster and polyatomic primary ion beams
Book chapter, 2013

Author

John Fletcher

University of Gothenburg

Other publications Research

Christopher Szakal

ToF-SIMS: Materials Analysis by Mass Spectrometry, 2nd Ed.

291-310
978-1-906715-17-5 (ISBN)

Subject Categories

Analytical Chemistry

Materials Chemistry

Condensed Matter Physics

ISBN

978-1-906715-17-5

More information

Created

10/10/2017

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