Magnetic Scanning Probe Calibration Using Graphene Hall Sensor
Journal article, 2013

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

Epitaxial graphene

magnetic probe calibration

Kelvin probe force microscopy (KPFM)

Hall sensor

Author

V. Panchal

Royal Holloway University of London

National Physical Laboratory (NPL)

O. Iglesias-Freire

Spanish National Research Council (CSIC)

Arseniy Lartsev

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

R. Yakimova

Linköping University

A. Asenjo

Spanish National Research Council (CSIC)

O. Kazakova

National Physical Laboratory (NPL)

IEEE Transactions on Magnetics

0018-9464 (ISSN)

Vol. 49 7 3520-3523 6558904

Subject Categories (SSIF 2011)

Materials Engineering

Other Engineering and Technologies

DOI

10.1109/tmag.2013.2243127

More information

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3/9/2025 1