Magnetic Scanning Probe Calibration Using Graphene Hall Sensor
Artikel i vetenskaplig tidskrift, 2013

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

Epitaxial graphene

magnetic probe calibration

Kelvin probe force microscopy (KPFM)

Hall sensor

Författare

V. Panchal

Royal Holloway University of London

National Physical Laboratory (NPL)

O. Iglesias-Freire

Consejo Superior de Investigaciones Científicas (CSIC)

Arseniy Lartsev

Chalmers, Mikroteknologi och nanovetenskap, Kvantkomponentfysik

R. Yakimova

Linköpings universitet

A. Asenjo

Consejo Superior de Investigaciones Científicas (CSIC)

O. Kazakova

National Physical Laboratory (NPL)

IEEE Transactions on Magnetics

0018-9464 (ISSN)

Vol. 49 7 3520-3523 6558904

Ämneskategorier (SSIF 2011)

Materialteknik

Annan teknik

DOI

10.1109/tmag.2013.2243127

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2025-03-09