Magnetic Scanning Probe Calibration Using Graphene Hall Sensor
Artikel i vetenskaplig tidskrift, 2013

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

Hall sensor

Epitaxial graphene

Kelvin probe force microscopy (KPFM)

magnetic probe calibration

Författare

V. Panchal

National Physical Laboratory (NPL)

Royal Holloway University of London

O. Iglesias-Freire

CSIC - Instituto de Ciencia de Materiales de Madrid (ICMM)

Arseniy Lartsev

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

R. Yakimova

Linköpings universitet

A. Asenjo

CSIC - Instituto de Ciencia de Materiales de Madrid (ICMM)

O. Kazakova

National Physical Laboratory (NPL)

IEEE Transactions on Magnetics

0018-9464 (ISSN)

Vol. 49 7 3520-3523

Ämneskategorier

Materialteknik

Annan teknik

DOI

10.1109/tmag.2013.2243127