Magnetic Scanning Probe Calibration Using Graphene Hall Sensor
Artikel i vetenskaplig tidskrift, 2013

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

Kelvin probe force microscopy (KPFM)

Epitaxial graphene

Hall sensor

magnetic probe calibration

Författare

V. Panchal

Royal Holloway University of London

National Physical Laboratory

O. Iglesias-Freire

CSIC - Instituto de Ciencia de Materiales de Madrid (ICMM)

Arseniy Lartsev

Chalmers, Mikroteknologi och nanovetenskap (MC2), Kvantkomponentfysik

R. Yakimova

Linköpings universitet

A. Asenjo

CSIC - Instituto de Ciencia de Materiales de Madrid (ICMM)

O. Kazakova

National Physical Laboratory

IEEE Transactions on Magnetics

0018-9464 (ISSN)

Vol. 49 3520-3523

Ämneskategorier

Materialteknik

Annan teknik

DOI

10.1109/tmag.2013.2243127