Atom probe tomography analysis of WC powder
Journal article, 2013
apt analysis
carbides
Analysis of submicron particles
APT
co
focused ion-beam
Specimen preparation
Author
Jonathan Weidow
Chalmers, Applied Physics, Materials Microstructure
Ultramicroscopy
0304-3991 (ISSN) 1879-2723 (eISSN)
Vol. 132 295-299Subject Categories
Chemical Sciences
DOI
10.1016/j.ultramic.2013.01.008