0.5-Tb/s eye-diagram measurement by optical sampling using XPM-induced wavelenght shifting in highly nonlinear fiber
Journal article, 2004
Author
J Li
Mathias Westlund
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Henrik Sunnerud
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Magnus Karlsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Peter Andrekson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
IEEE Photonic Technology Letters
Vol. 16 566-568
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering