0.5-Tb/s eye-diagram measurement by optical sampling using XPM-induced wavelenght shifting in highly nonlinear fiber
Journal article, 2004

Author

J Li

Mathias Westlund

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Henrik Sunnerud

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Magnus Karlsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Peter Andrekson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

IEEE Photonic Technology Letters

Vol. 16 566-568

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

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Created

10/8/2017