PC2: Identifying noise processes in superconducting resonators
Paper in proceedings, 2013

Extensive studies of dielectric loss due to two level fluctuators (TLFs) in superconducting resonators have provided routes for low loss resonators. The research is motivated not only by the use of resonators as detectors and in quantum information processing, but more generally due to TLFs being a source of noise and decoherence in all quantum devices. In this work a frequency locked loop was used to measure frequency fluctuations at timescales in excess of 104 seconds, thereby accurately probing the TLF induced low- frequency noise of the resonator. Our measurement method lead to very high statistical confidence even for very long timescales, and here we can therefore present results explicitly identifying power dependent flicker frequency noise (S = 1/fa where a=1) persisting down to the mHz level.

Two level fluctuators

superconducting device

1/f noise

Author

J. Burnett

Royal Holloway University of London

National Physical Laboratory (NPL)

Tobias Lindström

National Physical Laboratory (NPL)

I. Wisby

Royal Holloway University of London

National Physical Laboratory (NPL)

Sebastian Erik de Graaf

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Astghik Adamyan

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Andrey Danilov

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Sergey Kubatkin

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Philip J. Meeson

Royal Holloway University of London

A.Y. Tzalenchuk

National Physical Laboratory (NPL)

Royal Holloway University of London

2013 IEEE 14th InternationalSuperconductive Electronics Conference, ISEC 2013

Art. no. 6604284-

Subject Categories

Physical Sciences

DOI

10.1109/ISEC.2013.6604284

ISBN

9781467363716

More information

Latest update

5/29/2018