High-energy surface X-ray diffraction for fast surface structure determination
Journal article, 2014
Understanding the interaction between surfaces and their surroundings is crucial in many materials-science fields such as catalysis, corrosion, and thin-film electronics, but existing characterization methods have not been capable of fully determining the structure of surfaces during dynamic processes, such as catalytic reactions, in a reasonable time frame. We demonstrate an x-ray-diffraction–based characterization method that uses high-energy photons (85 kiloelectron volts) to provide unexpected gains in data acquisition speed by several orders of magnitude and enables structural determinations of surfaces on time scales suitable for in situ studies. We illustrate the potential of high-energy surface x-ray diffraction by determining the structure of a Pd surface in situ during catalytic CO oxidation and follow dynamic restructuring of the surface with subsecond time resolution.
Author
Johan Gustafson
Lund University
Mikhail Shipilin
Lund University
Chu Zhang
Lund University
Andreas Stierle
Universität Hamburg
Deutsches Elektronen-Synchrotron (DESY)
Uta Hejral
Deutsches Elektronen-Synchrotron (DESY)
Universität Hamburg
Uta Ruett
Deutsches Elektronen-Synchrotron (DESY)
Olof Gutowski
Deutsches Elektronen-Synchrotron (DESY)
Per-Anders Carlsson
Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry
Competence Centre for Catalysis (KCK)
Magnus Skoglundh
Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry
Competence Centre for Catalysis (KCK)
Edvin Lundgren
Lund University
Science
0036-8075 (ISSN)
Vol. 343 6172 758-761Time-resolved in situ methods for design of catalytic sites within sustainable chemistry
Swedish Research Council (VR), 2013-01-01 -- 2016-12-31.
Driving Forces
Sustainable development
Areas of Advance
Nanoscience and Nanotechnology (2010-2017)
Transport
Energy
Materials Science
Subject Categories
Physical Chemistry
Chemical Process Engineering
Atom and Molecular Physics and Optics
Condensed Matter Physics
Roots
Basic sciences
DOI
10.1126/science.1246834