The EMRP project GraphOhm- Towards quantum resistance metrology based on graphene
Paper in proceeding, 2014

A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.


quantum hall effect


Measurement standards


F.J. Ahlers

Physikalisch-Technische Bundesanstalt (PTB)

J.L. Kučera

Czech metrology institute

W. Poirier

Laboratoire National De Metrologie Et D'essais (LNE)

B. Jeanneret

Federal Institute of Metrology (METAS)

A.F. Satrapinski

Mittatekniikan Keskus (MIKES)

A.Y. Tzalenchuk

NPL Management

P. Vrabček

T. Bergsten

SP Sveriges Tekniska Forskningsinstitut AB

C. Hwang

Korea Research Institute of Standards and Science (KRISS)

R. Yakimova

Linköping University

Sergey Kubatkin

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

CPEM Digest. 29th Conference on Precision Electromagnetic Measurements, CPEM 2014; Rio de Janeiro; Brazil; 24 August 2014 through 29 August 2014

0589-1485 (ISSN)

978-147995205-2 (ISBN)

Subject Categories

Physical Sciences





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9/6/2018 2