A Probabilistic Analysis of Resilient Reconfigurable Designs
Paper in proceeding, 2014
Reconfigurable hardware
Fault tolerance
MPSOC
coarse-grain
fine-grain
Author
Alirad Malek
Chalmers, Computer Science and Engineering (Chalmers), Computer Engineering (Chalmers)
Stavros Tzilis
Chalmers, Computer Science and Engineering (Chalmers), Computer Engineering (Chalmers)
Danish Anis Khan
Chalmers, Computer Science and Engineering (Chalmers)
Ioannis Sourdis
Chalmers, Computer Science and Engineering (Chalmers), Computer Engineering (Chalmers)
G. Smaragdos
Erasmus University Rotterdam
C. Strydis
Erasmus University Rotterdam
27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, Netherlands, 1-3 October 2014
1550-5774 (ISSN)
141-146978-1-4799-6155-9 (ISBN)
Subject Categories
Embedded Systems
Computer Systems
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/DFT.2014.6962074
ISBN
978-1-4799-6155-9