0.5 Tbit/s eye-diagram measurement by optical sampling using XPM-induced wavelength shifting in highly nonlinear fiber
Journal article, 2003
Author
Jie Li
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Mathias Westlund
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Henrik Sunnerud
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Bengt-Erik Olsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Magnus Karlsson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Peter Andrekson
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
IEEE Photonics Technology Letters
1041-1135 (ISSN) 19410174 (eISSN)
Vol. 16 2 566-568Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/LPT.2003.821088