0.5 Tbit/s eye-diagram measurement by optical sampling using XPM-induced wavelength shifting in highly nonlinear fiber
Journal article, 2003

In this letter, we report on a novel all-optical sampling scheme using cross-phase modulation-induced wavelength shifting and optical filtering. Up to 500-Gb/s optical signal eye-diagram measurements have been demonstrated for the first time with a temporal resolution of 0.7 ps. Signal operational wavelength range covering basically the whole erbium-doped fiber amplifier gain range (1535-1569 nm) with temporal resolutions equal to or less than 1 ps was also demonstrated in the experiment. These results show that the sampling system is suitable for directly monitoring and evaluating ultrahigh bit-rate optical time-division multiplexed data at or above 160 Gb/s.

Author

Jie Li

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Mathias Westlund

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Henrik Sunnerud

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Bengt-Erik Olsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Magnus Karlsson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

Peter Andrekson

Chalmers, Microtechnology and Nanoscience (MC2), Photonics

IEEE Photonics Technology Letters

1041-1135 (ISSN) 19410174 (eISSN)

Vol. 16 2 566-568

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/LPT.2003.821088

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