Effective Dielectric Permittivity of r-Cut Sapphire Microstrip
Paper in proceeding, 1994
The effective dielectric constant of a microstrip is given as a function of the strip geometry and its orientation on the surface of the substrate. An "isotropized" dielectric constant is inroduced which can be used in commercial microwave software for simulation of r-cut sapphire substrate based micrstrip devices. Experimental velification of the analysis is also given.
Dielectric constant Dielectric losses Dielectric substrates Microstrip components Permittivity Strips Superconducting microwave devices Tensile stress Thermal conductivity Yttrium barium copper oxide
Author
Irina Vendik
Orest Vendik
Spartak Gevorgian
Department of Microelectronics and Nanoscience
Microwave Conference, 1994. 24th European
Vol. 1 395 - 400
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/EUMA.1994.337241