Effective Dielectric Permittivity of r-Cut Sapphire Microstrip
Paper i proceeding, 1994

The effective dielectric constant of a microstrip is given as a function of the strip geometry and its orientation on the surface of the substrate. An "isotropized" dielectric constant is inroduced which can be used in commercial microwave software for simulation of r-cut sapphire substrate based micrstrip devices. Experimental velification of the analysis is also given.

Dielectric constant Dielectric losses Dielectric substrates Microstrip components Permittivity Strips Superconducting microwave devices Tensile stress Thermal conductivity Yttrium barium copper oxide

Författare

Irina Vendik

Orest Vendik

Spartak Gevorgian

Institutionen för mikroelektronik och nanovetenskap

Microwave Conference, 1994. 24th European

Vol. 1 395 - 400

Ämneskategorier

Elektroteknik och elektronik

DOI

10.1109/EUMA.1994.337241