Effective Dielectric Permittivity of r-Cut Sapphire Microstrip
Paper i proceeding, 1994
The effective dielectric constant of a microstrip is given as a function of the strip geometry and its orientation on the surface of the substrate. An "isotropized" dielectric constant is inroduced which can be used in commercial microwave software for simulation of r-cut sapphire substrate based micrstrip devices. Experimental velification of the analysis is also given.
Dielectric constant Dielectric losses Dielectric substrates Microstrip components Permittivity Strips Superconducting microwave devices Tensile stress Thermal conductivity Yttrium barium copper oxide
Författare
Irina Vendik
Orest Vendik
Spartak Gevorgian
Institutionen för mikroelektronik och nanovetenskap
Microwave Conference, 1994. 24th European
Vol. 1 395 - 400
Ämneskategorier
Elektroteknik och elektronik
DOI
10.1109/EUMA.1994.337241