Characterization of Interface Defects
Book chapter, 2013
Interface defect
Low frequency noise
Charge pumping
LF noise
C-V response
Author
P.K. Hurley
Tyndall National Institute at National University of Ireland, Cork
Olof Engström
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
D. Bauza
Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation
G. Ghibaudo
Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation
Nanoscale CMOS (ed. Balestra)
545-573
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1002/9781118621523.ch15