Characterization of Interface Defects
Book chapter, 2010

LF noise

Charge pumping

Interface defect

C-V response

Low frequency noise

Author

P.K. Hurley

Tyndall National Institute at National University of Ireland, Cork

Olof Engström

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

D. Bauza

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

G. Ghibaudo

Institut de la Microelectronique, Electromagnetisme et Photonique - Laboratoire d'Hyperfrequences et de Caracterisation

Nanoscale CMOS (ed. Balestra)

545-573

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1002/9781118621523.ch15

ISBN

9781848211803

More information

Created

10/7/2017