Raman scattering studies of dilute InP1-xBix alloys reveal unusually strong oscillator strength for Bi-induced modes
Journal article, 2015
Raman scattering
molecular beam epitaxy
dilute bismides
InPBi
oscillator strength
Author
W. W. Pan
Chinese Academy of Sciences
J.A. Steele
University of Wollongong
P. Wang
Chinese Academy of Sciences
K. Wang
Chinese Academy of Sciences
Yuxin Song
Chinese Academy of Sciences
L. Yue
Chinese Academy of Sciences
X. Wu
Chinese Academy of Sciences
H. Xu
Chinese Academy of Sciences
Z. Zhang
Chinese Academy of Sciences
S. Xu
The University of Hong Kong
P. F. Lu
Beijing University of Posts and Telecommunications (BUPT)
L. Wu
Beijing University of Posts and Telecommunications (BUPT)
Q. Gong
Chinese Academy of Sciences
Shu Min Wang
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Semiconductor Science and Technology
0268-1242 (ISSN) 1361-6641 (eISSN)
Vol. 30 9 094003Subject Categories
Manufacturing, Surface and Joining Technology
Nano Technology
DOI
10.1088/0268-1242/30/9/094003