TEM investigation on stress contrast and interfaces of contacting particles, Materials Characterization
Magazine article, 2000

An investigation on nanoparticle contacting using convergent beam electron diffraction (CBED) and high-resolution electron microscopy (HREM) is reported. Cobalt particles (5–200nm) from a solution-treated Cu–2(w/o)Co alloy were extracted and allowed to contact without pressure. The contacting stress field due to adhesion was clearly observed, and the stress field had a dipole character. Free particles were observed to contact along low-index zone axes and with specific orientation relationships. Fourier transformation of the HREM micrographs revealed a highly distorted area along the contacting boundary containing dislocations. Electron-diffraction contrast from the stress fields between contacting particles was simulated, and agreed well with the experiments. © Elsevier Science Inc., 2000. All rights reserved.


Yiming Yao

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis

A.R. Thölén

Chalmers, Department of Experimental Physics, Microscopy and Microanalysis


Vol. 44 441-452

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Nanoscience and Nanotechnology (2010-2017)

Materials Science

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