Improvement of Oscilloscope Based RF Measurements by Statistical Averaging Techniques
Paper in proceeding, 2006
Author
Christian Fager
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Kristoffer Andersson
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
IEEE MTT-S International Microwave Symposium Digest
0149645X (ISSN)
1460-1463 4015206Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/MWSYM.2006.249565