The influence of the gate leakage current and the gate resistance on the noise and gain performances of 90-nm CMOS for micro- and millimeter-wave frequencies
Journal article, 2004
Author
Hans-Olof Vickes
Mattias Ferndahl
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Anowar Masud
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Herbert Zirath
Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics
Microwave Symposium Digest , 2004 IEEE MTT-S International
0149-645X (ISSN)
Vol. 2 971-974Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering