Atom probe tomography of a Ti-Si-Al-C-N coating grown on a cemented carbide substrate
Journal article, 2015
Cemented carbide cutting tools
Diffusion
Physical vapour deposition
Nitrides
Atom probe tomography
Author
Mattias Thuvander
Chalmers, Applied Physics, Materials Microstructure
Gustaf Östberg
Chalmers, Applied Physics, Materials Microstructure
M. Ahlgren
Sandvik
Lena Falk
Chalmers, Applied Physics, Materials Microstructure
Ultramicroscopy
0304-3991 (ISSN) 1879-2723 (eISSN)
Vol. 159 308-313Subject Categories
Other Materials Engineering
DOI
10.1016/j.ultramic.2015.04.008
PubMed
25956619