A brief overview of atomic layer deposition and etching in the semiconductor processing
Paper in proceeding, 2016
self-limiting behavior
atomic layer deposition
semiconductor processing
atomic layer etching
Author
G. Yuan
Shanghai University
N. Wang
Shanghai University
Shirong Huang
Shanghai University
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
2016 17th International Conference on Electronic Packaging Technology, ICEPT 2016
1365-1368
978-150901396-8 (ISBN)
Subject Categories
Other Materials Engineering
DOI
10.1109/ICEPT.2016.7583377
ISBN
978-150901396-8