Noise Properties of YBCO Nanostructures
Journal article, 2017

Voltage noise measurements on close to optimally doped YBa2Cu3O7-delta nanostructures have been performed. The measured resistance noise at temperature T = 96 K (above critical temperature T-C = 85 K) shows a quadratic dependence on the bias current, e.g., the voltage power spectral density S-V alpha V-2. Moreover, the normalized voltage noise S-V/V-2 is inversely proportional to the device volume. This is a clear indication that the noise is the result of an ensemble of independent resistive fluctuators, evenly distributed within the sample volume. For our structures, we obtain a product S-V/V-2 x Vol. = const. approximate to 6 x 10-(33) m(3)/Hz resulting in a Hooge's parameter 3.4 x 10(-4), which is among the lowest reported in literature. At lower temperature, T = 2 K (well below TC) the total voltage fluctuations are given by the combined effect of critical current fluctuations and resistance fluctuations. For the critical current noise, we obtain a product S-I/IC2 x Vol. = const. approximate to 6x10(-32) m(3)/Hz. The larger value of the relative critical current noise is most probably due to the fact that the critical current is determined by edge effects whereas the resistance is given by the total volume of the device.

resistance noise

flicker noise

noise

HTS

critical current noise

nanostructure

YBCO

Author

Edoardo Trabaldo

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Marco Arzeo

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Riccardo Arpaia

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Reza Baghdadi

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Eric Andersson

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Floriana Lombardi

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

Thilo Bauch

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

IEEE Transactions on Applied Superconductivity

1051-8223 (ISSN) 15582515 (eISSN)

Vol. 27 4 7835723

Subject Categories

Physical Sciences

Condensed Matter Physics

DOI

10.1109/tasc.2017.2660306

More information

Latest update

4/6/2022 6