In-Situ TEM characterization of the effect of interfaces on charge transport in Cu(In,Ga)Se2 thin film solar cells

Gustaf Östberg; E. Yucelen; Krister Svensson; Eva Olsson

doi:10.1017/S1431927609097980

In-Situ TEM characterization of the effect of interfaces on charge transport in Cu(In,Ga)Se2 thin film solar cells
Journal article, 2009

Author

Gustaf Östberg

Chalmers, Applied Physics, Microscopy and Microanalysis

Other publications Research

E. Yucelen

FEI Company

Krister Svensson

Karlstad University

Eva Olsson

Chalmers, Applied Physics, Microscopy and Microanalysis

Other publications Research

Microscopy and Microanalysis

1431-9276 (ISSN) 1435-8115 (eISSN)

Vol. 15 SUPPL. 2 712-713

Subject Categories

Other Engineering and Technologies

DOI

10.1017/S1431927609097980

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5/23/2018

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