Harmonic Distortion Analysis of InP HBTs with 650 GHz f(max) for High Data Rate Communication Systems
Paper in proceeding, 2017

High frequency (h.f.) harmonic distortion (HD) of advanced InP heterojunction bipolar transistors (HBTs) with various emitter widths was investigated. Geometry scalable parameters for the compact model (CM) HICUM/L2 v. 2.34, featuring a two-region base-collector capacitance formulation, were extracted from temperature dependent DC and AC measurements of HBTs and from the special test structures. Single tone harmonic distortion and active two tone load pull measurements were carried out for different emitter area devices. The compact model was used for data analysis.

harmonic distortion

noise measurements

compact modeling

linearity

Heterojunction bipolar transistor

intermodulation distortion

Author

P. Sakalas

Center for Physical Sciences & Technology

Technische Universität Dresden

M. Schroter

Technische Universität Dresden

University of California

T. Nardmann

Technische Universität Dresden

Herbert Zirath

Chalmers, Microtechnology and Nanoscience (MC2), Microwave Electronics

Published in

IEEE Compound Semiconductor Integrated Circuit Symposium Technical Digest

1550-8781 (ISSN)

Vol. 2017-January
978-1-5090-6069-6 (ISBN)

Conference

39th IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
Miami, USA, 2017-10-21 - 2017-10-24

Categorizing

Subject Categories (SSIF 2011)

Applied Mechanics

Infrastructure Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

Identifiers

DOI

10.1109/CSICS.2017.8240429

More information

Latest update

7/12/2024