Correlation between Electrical Transport and Nanoscale Strain in InAs/In0.6Ga0.4As Core-Shell Nanowires
Journal article, 2018
InAs nanowire
transmission electron microscopy
piezoresistance
strain mapping
Author
Lunjie Zeng
Chalmers, Physics, Eva Olsson Group
Christoph Gammer
Erich Schmid Institute of Materials Science (ESI)
Burak Ozdol
Lawrence Berkeley National Laboratory
Thomas Nordqvist
Niels Bohr Institute
J. Nygard
Niels Bohr Institute
P. Krogstrup
Niels Bohr Institute
Andrew M. Minor
University of California
Lawrence Berkeley National Laboratory
Wolfgang Jäger
Chalmers, Physics, Eva Olsson Group
University of Kiel
Eva Olsson
Chalmers, Physics, Eva Olsson Group
Nano Letters
1530-6984 (ISSN) 1530-6992 (eISSN)
Vol. 18 8 4949-4956In Situ transmissionselektronmikroskopi studier av inverkan av mekanisk töjning hos halvledande nanotrådar
Swedish Research Council (VR) (2016-04618), 2017-01-01 -- 2020-12-31.
Areas of Advance
Nanoscience and Nanotechnology
Subject Categories
Analytical Chemistry
Materials Chemistry
Nano Technology
Condensed Matter Physics
DOI
10.1021/acs.nanolett.8b01782