On V-ce Method: In Situ Temperature Estimation and Aging Detection of High-Current IGBT Modules Used in Magnet Power Supplies for Particle Accelerators
Journal article, 2019
particle accelerators
measuring circuits design
insulated gate bipolar transistor (IGBT)
temperature monitoring
magnet power supplies
Aging detection
V-ce method
Author
Panagiotis Asimakopoulos
CERN
Chalmers, Electrical Engineering, Electric Power Engineering
Konstantinos Papastergiou
CERN
Torbjörn Thiringer
Chalmers, Electrical Engineering, Electric Power Engineering
Massimo Bongiorno
Chalmers, Electrical Engineering, Electric Power Engineering
Gilles Le Godec
CERN
IEEE Transactions on Industrial Electronics
0278-0046 (ISSN) 15579948 (eISSN)
Vol. 66 1 551-560 8331865Subject Categories (SSIF 2011)
Accelerator Physics and Instrumentation
Other Chemical Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
Areas of Advance
Energy
DOI
10.1109/TIE.2018.2823689