On V-ce Method: In Situ Temperature Estimation and Aging Detection of High-Current IGBT Modules Used in Magnet Power Supplies for Particle Accelerators
Journal article, 2019
measuring circuits design
Aging detection
insulated gate bipolar transistor (IGBT)
magnet power supplies
V-ce method
temperature monitoring
particle accelerators
Author
Panagiotis Asimakopoulos
CERN
Chalmers, Electrical Engineering, Electric Power Engineering
Konstantinos Papastergiou
CERN
Torbjörn Thiringer
Chalmers, Electrical Engineering, Electric Power Engineering
Massimo Bongiorno
Chalmers, Electrical Engineering, Electric Power Engineering
Gilles Le Godec
CERN
IEEE Transactions on Industrial Electronics
0278-0046 (ISSN) 15579948 (eISSN)
Vol. 66 1 551-560 8331865Subject Categories
Accelerator Physics and Instrumentation
Other Chemical Engineering
Other Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/TIE.2018.2823689