IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies
Journal article, 2019

This paper proposes a method for assessing the integrity of a series of insulated-gate bipolar transistor (IGBT) power stacks during factory-acceptance tests and service stops. The key challenge that is addressed in this paper is detecting common assembly issues that affect the power stack thermal path as well as distinguishing the acute aging effects of bond-wire lift-off and solder delamination. The method combines offline Vce measurements with current in the extended Zero Temperature Coefficient (ZTC) operating region as well as with sensing current without modifications to the power stack. It also employs on-the-stack Vce calibration for both the measurements. Additionally, only a fixed duty cycle pattern is needed to control the switches. The paper also presents a sensitivity analysis of the method to various parameters such as the current level in the extended ZTC operating region, the precision of the Vce measurement, as well as the ambient, the cooling-water, and the junction temperatures. The experimental results are obtained from a high-current IGBT power stack used in a magnet power supply for particle accelerators and are compared favorably to results from finite element method and lumped parameter network simulations confirming the applicability of the method.

thermal performance

Aging detection

insulatedgate bipolar transistor (IGBT)

particle accelerators

Vce method

condition monitoring

Author

Panagiotis Asimakopoulos

European Organization for Nuclear Research (CERN)

K. Papastergiou

European Organization for Nuclear Research (CERN)

Torbjörn Thiringer

Chalmers, Electrical Engineering, Electric Power Engineering, Electrical Machines and Power Electronics

Massimo Bongiorno

Chalmers, Electrical Engineering, Electric Power Engineering, Power grids and Components

Gilles Le Godec

European Organization for Nuclear Research (CERN)

IEEE Transactions on Power Electronics

0885-8993 (ISSN)

Vol. 34 11 11228-11240 8644005

Subject Categories

Energy Engineering

Other Physics Topics

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/TPEL.2019.2900393

More information

Latest update

11/10/2019