Mechanical properties of a novel multi-scale silver paste for electronics interconnect application
Paper in proceeding, 2019
Electronics packaging
SCA particles
High power electronics
Temperature
Shear strength
Sintered carbides
Silver paste
Silicon carbide
Semiconductor device manufacture
Mechanical properties
Author
Yongqian Sun
Shanghai University
Xiuzhen Lu
Shanghai University
Q. Zhang
Shanghai University
Xiao Xin Zhang
Shanghai University
Johan Liu
Chalmers, Microtechnology and Nanoscience (MC2), Electronics Material and Systems
L. Ye
SHT Smart High-Tech
2019 20th International Conference on Electronic Packaging Technology, ICEPT 2019
9081004
978-172815064-2 (ISBN)
Hong Kong, China,
Subject Categories
Ceramics
Materials Chemistry
Electrical Engineering, Electronic Engineering, Information Engineering
DOI
10.1109/ICEPT47577.2019.245310