Structural property study for GeSn thin films
Journal article, 2020
Structural property
XRD
GeSn
Author
Liyao Zhang
University of Shanghai for Science and Technology
Y Song
Chinese Academy of Sciences
Nils von den Driesch
Forschungszentrum Jülich
RWTH Aachen University
Z. Zhang
Chinese Academy of Sciences
Dan Buca
Forschungszentrum Jülich
Detlev Grützmacher
Forschungszentrum Jülich
RWTH Aachen University
Shu Min Wang
Chinese Academy of Sciences
Chalmers, Microtechnology and Nanoscience (MC2), Photonics
Published in
Materials
19961944 (eISSN)
Vol. 13 Issue 16 art. no 3645Categorizing
Subject Categories (SSIF 2011)
Inorganic Chemistry
Materials Chemistry
Condensed Matter Physics
Identifiers
DOI
10.3390/MA13163645
PubMed
32824570