Dispersion of the surface phonons in semiconductor/topological insulator Si/Bi2 Te3 heterostructure studied by high resolution Brillouin spectroscopy
Journal article, 2021
Topological insulator
Finite Element Method
Surface phonons
Brillouin spectroscopy
Electron phonon coupling
Rayleigh and Sezawa waves
Elastic properties
Author
A. Trzaskowska
Adam Mickiewicz University in Poznań
S. Mielcarek
Adam Mickiewicz University in Poznań
M. Wiesner
Adam Mickiewicz University in Poznań
Floriana Lombardi
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
B. Mroz
Adam Mickiewicz University in Poznań
Ultrasonics
0041-624X (ISSN)
Vol. 117 106526Subject Categories
Atom and Molecular Physics and Optics
Other Physics Topics
Condensed Matter Physics
DOI
10.1016/j.ultras.2021.106526
PubMed
34303926