Texture tomography with high angular resolution utilizing sparsity
Journal article, 2025
X-ray diffraction computed tomography
3D X-ray diffraction
tomography
XRDCT
3D-XRD
texture analysis
Author
Mads Carlsen
Paul Scherrer Institut
Florencia Malamud
Paul Scherrer Institut
Peter Modregger
University of Siegen
Deutsches Elektronen-Synchrotron (DESY)
Anna Wildeis
University of Siegen
Markus Hartmann
University of Siegen
Robert Brandt
University of Siegen
Andreas Menzel
Paul Scherrer Institut
Marianne Liebi
Paul Scherrer Institut
Swiss Federal Institute of Technology in Lausanne (EPFL)
Chalmers, Physics, Materials Physics
Journal of Applied Crystallography
0021-8898 (ISSN) 1600-5767 (eISSN)
Vol. 58 484-494Subject Categories (SSIF 2025)
Materials Chemistry
DOI
10.1107/S1600576725001426