Techniques for estimation of biological contamination on insulators using image analysis
Paper in proceedings, 2004

edge detection

remaining creepage distance

photography

image classification

flashover

flashover voltage measurements

insulator biological contamination estimation

fungal growth patterns

image classification

automatic insulator recognition

insulator contamination

fungal covered area

digital image analysis

edge detection

nonsupervised measurements

composite insulators

image segmentation

image segmentation

composite insulators

contamination characterization

Author

Andreas Dernfalk

Department of Electric Power Engineering, High voltage engineering

Stanislaw Gubanski

Department of Electric Power Engineering, High voltage engineering

Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on

659 - 662

Subject Categories

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017