Techniques for estimation of biological contamination on insulators using image analysis
Paper in proceeding, 2004
edge detection
remaining creepage distance
photography
image classification
flashover
flashover voltage measurements
insulator biological contamination estimation
fungal growth patterns
image classification
automatic insulator recognition
insulator contamination
fungal covered area
digital image analysis
edge detection
nonsupervised measurements
composite insulators
image segmentation
image segmentation
composite insulators
contamination characterization
Author
Andreas Dernfalk
Department of Electric Power Engineering, High voltage engineering
Stanislaw Gubanski
Department of Electric Power Engineering, High voltage engineering
Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04. 2004 Annual Report Conference on
659 - 662
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering