Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions

Journal article, 2008

In this work, spectroscopic ellipsometry and vector network analysis are used to determine the electromagnetic response of three samples, an epoxy polymer, a sample with ferrit-based nanoparticles in a polymer matrix and silicon, in the wavelength ranges 0.4-30 µm and 0.75- 7.59 cm. Both methods measure amplitude and phase changes due to interaction with a sample and can be used to measure the full complex-valued dielectric response to electromagnetic radiation. The data from the two methods show similar levels of the response at the two ends of the spectral gap between the ranges of the two methods.