Spectroscopic ellipsometry and vector network analysis for determination of the electromagnetic response in two wavelength regions
Artikel i vetenskaplig tidskrift, 2008
In this work, spectroscopic ellipsometry and vector network
analysis are used to determine the electromagnetic
response of three samples, an epoxy polymer, a sample
with ferrit-based nanoparticles in a polymer matrix and
silicon, in the wavelength ranges 0.4-30 µm and 0.75-
7.59 cm. Both methods measure amplitude and phase
changes due to interaction with a sample and can be used
to measure the full complex-valued dielectric response to
electromagnetic radiation. The data from the two methods
show similar levels of the response at the two ends of
the spectral gap between the ranges of the two methods.