Noise Properties of the Single Electron Transistor
Doctoral thesis, 2008
The Single Electron Transistor (SET) is a sensitive electrometer with a charge sensitivity
ultimately limited by noise. In this thesis we present measurements of noise
properties and charge sensitivity of the radio-frequency Single Electron Transistor.
The charge sensitivity for the radio frequency Single Electron Transistor (rf-SET)
was measured, as a function of different parameters. The demonstrated result is better
than the previously best reported sensitivity value both at 40 mK, and at 4.2K. The
charge sensitivity at 40mK is 0.9μe/√Hz, 5 times worse than theoretical limit. The
charge sensitivity at 4.2K is 1.8 μe/√Hz, only 1.6 times worse then the theoretical
limit for this temperature. The limiting factor is the amplifier noise but shot/thermal
noise starts to be important.
The SET was operated in the radio frequency mode which allowed to measure the
low frequency noise of the SET in a wide frequency range from few Hz up to tenths
MHz. Noise spectra were measured over a wide range of the gate voltage and bias
voltage. In the data analysis we are able to separate noise contributions from different
noise sources in the SET.
From the low frequency noise measurements, we conclude that the noise spectrum
in the frequency range (f > 10 kHz) is dominated by electron capture and emission
kinetics on a electrostatic trap most probably consisting of a metallic grains outside the
tunnel barrier.
We have also introduced a method of direct measurement of the shot noise in the
SET in low-frequency limit. We have measured the shot noise properties of the single
electron transistor with high tunnel barrier transparencies, as a function of bias voltage
and gate charge and find a good agreement with the orthodox theory for single electron
tunneling.
Low-Frequency noise
Shot Noise
1/f noise
Single Electron Transistor
charge sensitivity
SET
electrometer
Coulomb blockade
radio-frequency Single Electron Transistor
RF-SET