Serguei Kafanov
Showing 10 publications
Measurement of the shot noise in a single-electron transistor
Charge noise in single-electron transistors and charge qubits may be caused by metallic grains
An ultrasensitive radio-frequency single-electron transistor working up to 4.2K
A single electron transistor on an atomic force microscope probe
Electron Transfer Dynamics of Bistable Single-Molecule Junctions
Single molecular devices with fullerenes and oligophenylenevinylene (OPV) derivatives
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