High resolution imaging by organic secondary ion mass spectrometry.
Review article, 2007

Secondary-ion mass spectrometry (SIMS) is based on the acceleration of high-energy primary ions onto a target. Secondary electrons, neutrals and ions are emitted from the target, reflecting its chemical composition. This enables simultaneous analysis and localization of target molecules, giving valuable information that is difficult or impossible to obtain with other analytical methods. The secondary ions can be extracted and detected by any type of mass analyzer. SIMS is unique in its ability to detect several target molecules simultaneously in small samples and to image their localization at subcellular resolution. The recent development of bioimaging SIMS opens up new possibilities in biotechnology and biological research with applications in biomedicine and pathology. The current development of this technique has the potential to become as important for biotechnology as the advent of the electron microscope, confocal microscope or in situ hybridization.

Animals

Biotechnology

Mice

methods

Spectrometry

Imaging

Mass

Humans

methods

Three-Dimensional

Secondary Ion

Author

Håkan Nygren

University of Gothenburg

Per Malmberg

University of Gothenburg

Trends in Biotechnology

0167-7799 (ISSN)

Vol. 25 11 499-504

Subject Categories

Cell and Molecular Biology

DOI

10.1016/j.tibtech.2007.07.010

PubMed

17920142

More information

Created

10/10/2017