Leakage current effects on C-V plots of high-k MOS capacitors
Paper in proceedings, 2008


Y Lu

S. Hall

I. Z. Mitrovic

W.M. Davey

Bahman Raeissi

Chalmers, Microtechnology and Nanoscience (MC2)

Olof Engström

Chalmers, Applied Physics, Physical Electronics

K. Cherkaoui

S Monaghan

P.K. Hurley

H.D.B. Gottlob

M.C. Lemme

WODIM, Berlin, June 2008

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