Characterization of an entangled system of two superconducting qubits using a multiplexed capacitance measurement
Journal article, 2009

We characterize a pair of Cooper-pair boxes coupled with a fixed capacitor using spectroscopy and measurements of the ground-state quantum capacitance. We use the extracted parameters to estimate the concurrence or degree of entanglement between the two qubits. We also present a thorough demonstration of a multiplexed quantum capacitance measurement technique, which is in principle scalable to a large array of superconducting qubits.

Author

M. D. Shaw

Justin Schneiderman

J. Bueno

B. S. Palmer

Per Delsing

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

P. M. Echternach

Physical Review B - Condensed Matter and Materials Physics

1098-0121 (ISSN)

Vol. 79 1

Subject Categories

Physical Sciences

Condensed Matter Physics

DOI

10.1103/PhysRevB.79.014516

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Created

10/7/2017