Characterization of an entangled system of two superconducting qubits using a multiplexed capacitance measurement
Journal article, 2009

We characterize a pair of Cooper-pair boxes coupled with a fixed capacitor using spectroscopy and measurements of the ground-state quantum capacitance. We use the extracted parameters to estimate the concurrence or degree of entanglement between the two qubits. We also present a thorough demonstration of a multiplexed quantum capacitance measurement technique, which is in principle scalable to a large array of superconducting qubits.


M. D. Shaw

Justin Schneiderman

J. Bueno

B. S. Palmer

Per Delsing

Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics

P. M. Echternach

Physical Review B - Condensed Matter and Materials Physics

24699950 (ISSN) 24699969 (eISSN)

Vol. 79 1

Subject Categories

Physical Sciences

Condensed Matter Physics



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