Characterization of an entangled system of two superconducting qubits using a multiplexed capacitance measurement
Journal article, 2009
Author
M. D. Shaw
Justin Schneiderman
J. Bueno
B. S. Palmer
Per Delsing
Chalmers, Microtechnology and Nanoscience (MC2), Quantum Device Physics
P. M. Echternach
Physical Review B - Condensed Matter and Materials Physics
24699950 (ISSN) 24699969 (eISSN)
Vol. 79 1Subject Categories
Physical Sciences
Condensed Matter Physics
DOI
10.1103/PhysRevB.79.014516