Classification of energy levels in quantum dot structures by means of depletion layer spectroscopy methods
Paper in proceedings, 2009


M Kaniewska

Olof Engström

Chalmers, Applied Physics, Physical Electronics

M Kaczmarczyk

13th Internation Conference on Defects-Recognition, Imaging and Physics in Semiconductors, Wheeling, West Virginia, USA, September 13-17, 2009 (Invited)

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