Classification of energy levels in quantum dot structures by means of depletion layer spectroscopy methods
Paper i proceeding, 2009
Författare
M Kaniewska
Olof Engström
Chalmers, Teknisk fysik, Fysikalisk elektronik
M Kaczmarczyk
13th Internation Conference on Defects-Recognition, Imaging and Physics in Semiconductors, Wheeling, West Virginia, USA, September 13-17, 2009 (Invited)
Ämneskategorier
Annan teknik
Övrig annan teknik