Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers (Invited)
Journal article, 2010

Author

Olof Engström

Chalmers, Microtechnology and Nanoscience (MC2)

Bahman Raeissi

Chalmers, Microtechnology and Nanoscience (MC2)

Johan Piscator

Chalmers, Microtechnology and Nanoscience (MC2)

I. Z. Mitrovic

S. Hall

H. D. B. Gottlob

M Schmidt

Bahman Raeissi

K. Cherkaoui

Journal of Telecommunications and Information Technology

1509-4553 (ISSN) 1899-8852 (eISSN)

Vol. 1 10-

Areas of Advance

Information and Communication Technology

Nanoscience and Nanotechnology

Subject Categories

Other Engineering and Technologies not elsewhere specified

Electrical Engineering, Electronic Engineering, Information Engineering

More information

Created

10/7/2017