Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers (Invited)
Journal article, 2010
Author
Olof Engström
Chalmers, Microtechnology and Nanoscience (MC2)
Bahman Raeissi
Chalmers, Microtechnology and Nanoscience (MC2)
Johan Piscator
Chalmers, Microtechnology and Nanoscience (MC2)
I. Z. Mitrovic
University of Liverpool
S. Hall
University of Liverpool
H. D. B. Gottlob
Advanced Microelectronic Center Aachen (AMICA)
M Schmidt
Advanced Microelectronic Center Aachen (AMICA)
P.K- Hurley
University College Cork
K. Cherkaoui
Université de Lyon
Journal of Telecommunications and Information Technology
1509-4553 (ISSN) 1899-8852 (eISSN)
Vol. 1 10-Areas of Advance
Information and Communication Technology
Nanoscience and Nanotechnology
Subject Categories
Other Engineering and Technologies not elsewhere specified
Electrical Engineering, Electronic Engineering, Information Engineering