Dielectric response measurements during electrical treeing in sub-picofarad samples
Journal article, 2011

A technique called Arbitrary Waveform Impedance Spectroscopy (AWIS) developed for measuring dielectric properties in insulating materials has been used to study capacitance and dielectric loss changes during electrical tree growth in LDPE samples. The sample capacitance is small, in the range of 0.1–0.15 pF, placing high demands on the measurement system. Simulations in FEM-software show that the measured capacitance is in agreement with simulated values and can be used to estimate tree growth rate. It also seems to be possible to differentiate between different regions of tree growth by analyzing changes in capacitance and loss of the studied samples.

Author

Björn Sonerud

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Tord Bengtsson

ABB Corporate Research Center

Jörgen Blennow

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Stanislaw Gubanski

Chalmers, Materials and Manufacturing Technology, High Voltage Engineering

Susanne Nilsson

Chalmers, Chemical and Biological Engineering, Applied Surface Chemistry

Polymer Testing

0142-9418 (ISSN)

Vol. 30 1 43-49

Driving Forces

Innovation and entrepreneurship

Subject Categories

Other Materials Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

Areas of Advance

Materials Science

DOI

10.1016/j.polymertesting.2010.10.004

More information

Created

10/7/2017