Aging- and annealing-induced variations in Nb/Al-AlOx/Nb tunnel junction properties
Journal article, 2011

In this paper, we present studies of room temperature aging and annealing of Nb/Al–AlOx/Nb tunnel junctions with the size of 2–3 μm2. We observed a noticeable drop of junction normal resistance Rn unusually combined with increase in subgap resistance Rj as a result of aging. Variation in both Rn and Rj are subject to the junction size effect. An effect of aging history on the junction degradation after consequent annealing was discovered. Discussion and interpretation of the observed phenomena are presented in terms of structural ordering and reconstruction in the AlOx layer, driven by diffusion flows enhanced due to stress relaxation processes in the Al layer interfacing the AlOx layer.

aluminium

aluminium compounds

Josephson effect

superconducting materials

diffusion

ageing

niobium

annealing

Author

Alexey Pavolotskiy

Chalmers, Earth and Space Sciences, Advanced Receiver Development

Dimitar Milkov Dochev

Chalmers, Earth and Space Sciences, Advanced Receiver Development

Victor Belitsky

Chalmers, Earth and Space Sciences, Advanced Receiver Development

Journal of Applied Physics

0021-8979 (ISSN) 1089-7550 (eISSN)

Vol. 109 2 024502- 024502

Areas of Advance

Nanoscience and Nanotechnology (2010-2017)

Materials Science

Subject Categories

Other Engineering and Technologies not elsewhere specified

Other Electrical Engineering, Electronic Engineering, Information Engineering

Condensed Matter Physics

Roots

Basic sciences

DOI

10.1063/1.3532040

More information

Created

10/7/2017