Influence of waveguide width errors on TRL and LRL calibrations
Paper in proceedings, 2012

This paper investigates the impact of the waveguide width tolerance in TE10 mode waveguide TRL/LRL calibration kits. This is important for vector network analyzer measurements in the THZ range where waveguide tolerances become large compared the wavelength and to cross sectional dimensions. Besides causing reflections in the waveguide interface, the waveguide width tolerance also causes a change in the propagation constant that can shift the reference planes and cause problems in estimating the propagation constant of the Line standard. We conclude that the tolerances may cause a significant uncertainty contribution and may limit the useful band of the calibration kit.

waveguide

LRL

VNA

S-parameters

TRL

calibration

uncertainty

Author

Jörgen Stenarson

GigaHertz Centre

Klas Yhland

GigaHertz Centre

Thi Ngoc Do Thanh

GigaHertz Centre

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

Huan Zhao Ternehäll

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

GigaHertz Centre

Peter Sobis

GigaHertz Centre

Jan Stake

GigaHertz Centre

Chalmers, Microtechnology and Nanoscience (MC2), Terahertz and Millimetre Wave Laboratory

79th Automatic RF Techniques Microwave Measurement Conference (ARFTG)

6291182

Areas of Advance

Information and Communication Technology

Subject Categories

Control Engineering

Other Electrical Engineering, Electronic Engineering, Information Engineering

DOI

10.1109/ARFTG79.2012.6291182

ISBN

978-1-4673-1230-1

More information

Created

10/7/2017