Characterization and modeling of electrically active point defects in silicon/silcon dioxide structures
Doctoral thesis, 1991
MOS capacitors
electro-optical techniques
Author
Mats O. Andersson
Department of Solid State Electronics
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
91-7032-632-0
Technical report - School of Electrical and Computer Engineering, Chalmers University of Technology, Göteborg, Sweden: 220
Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie: 829