Using Heavy-ion Fault Injection to Evaluate Fault Tolerance with respect to Cluster Size in a Time-triggered Communication System
Paper in proceedings, 2003

Author

Håkan Sivencrona

M. Persson

Jan Torin

Chalmers, Department of Computer Engineering

Proceedings of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS-6) April 2003, Poznan 2003

171-176

Subject Categories

Computer and Information Science

ISBN

83-7143-557-6

More information

Created

10/6/2017