Characterisation of bipolar transistors : parameter extraction and degradation dynamics
Licentiate thesis, 1998
bipolar junction transistor
reverse-bias stress
early effect
Gummel-Poon transistor model
recovery dynamics
parameter extraction
stress dynamics
direct extraction
current gain degradation
series resistance extraction
Author
Fredrik Ingvarson
Department of Microelectronics
Subject Categories
Other Electrical Engineering, Electronic Engineering, Information Engineering
ISBN
91-7197-722-8
Technical report L - School of Electrical and Computer Engineering, Chalmers University of Technology. : 294