Fredrik Ingvarson

Publications (33)
Projects (0)

Showing 33 publications

2007

A Compact Resistance Model of an Array of Substrate Contacts for Applications in Noise Coupling Analysis

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson

Swedish System on Chip Conference

Other conference contribution

2007

Evaluation of Using Active Circuitry for Substrate Noise Suppression

Rashid Farivar, Simon Kristiansson, Fredrik Ingvarson et al

ACM Great Lakes Symposium on VLSI (GLSVLSI), p. 449-452

Paper in proceeding

2007

Evaluation of Active Cancellation of Substrate-Noise in Mixed-Signal ICs

Zargham Baghchehsaraei, Simon Kristiansson, Fredrik Ingvarson et al

IEEE Norchip Conference. Vol. 2007

Paper in proceeding

2007

Compact Spreading Resistance Model for Rectangular Contacts on Uniform and Epitaxial Substrates

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson

IEEE Transactions on Electron Devices. Vol. 54 (9), p. 2531-2536

Journal article

2006

Substrate Noise Reduction Using Active Circuitry

Rashid Farivar, Simon Kristiansson, Fredrik Ingvarson et al

Swedish System on Chip Conference

Other conference contribution

2006

A High-Frequency Extension of a Surface-Potential-Based Substrate Model for Noise Coupling Analysis

Nebojsa Simic, Fredrik Ingvarson, Simon Kristiansson et al

International Conference on Microelectronics

Journal article

2006

Properties and Modeling of Ground Structures for Reducing Substrate Noise Coupling in ICs

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson

IEEE International Symposium on Circuits and Systems

Paper in proceeding

2005

A comparison of the exact and an approximate solution for the resistance between two coplanar circular discs

Simon Kristiansson, Shiva P. Kagganti, Fredrik Ingvarson et al

Solid-State Electronics. Vol. 49 (2), p. 275-277

Journal article

2005

Modeling of Rectangular Contacts for Noise Coupling Analysis in Homogeneous Substrates

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson

23rd Norchip Conference, Oulu, Finland

Paper in proceeding

2005

A Surface Potential Model for Predicting Substrate Noise Coupling in Integrated Circuits

Simon Kristiansson, Fredrik Ingvarson, Shiva P. Kagganti et al

IEEE Journal of Solid-State Circuits. Vol. 40 (9), p. 1797-1803

Journal article

2005

Influence of Guard Bands on Substrate Noise Coupling

Simon Kristiansson, Fredrik Ingvarson, Kjell Jeppson

Proceedings of the Swedish System-on-Chip Conference 2005

Other conference contribution

2004

An empirical table based HBT large signal model

Iltcho Angelov, Dominique Schreurs, Kristoffer Andersson et al

34th European Microwave Conference. Vol. 1, p. 229-232

Paper in proceeding

2004

A Surface Potential Model for Predicting Substrate Noise Coupling in Integrated Circuits

Simon Kristiansson, Fredrik Ingvarson, Shiva P. Kagganti et al

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, CICC; Orlando, FL; United States; 3 October 2004 through 6 October 2004, p. 497-500

Paper in proceeding

2004

Resistance Modeling in 1D, 2D, and 3D for Substrate Networks

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al

Physica Scripta. Vol. T114, p. 217-222

Journal article

2003

Resistance Modelling in 1D, 2D, and 3D for Substrate Networks

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al

Nordic Semiconductor Meeting, Tampere, Finland

Paper in proceeding

2003

Substrate Resistance Modeling for Noise Coupling Analysis

Simon Kristiansson, Shiva P. Kagganti, Ewert Tony et al

International Conference on Microelectronics Test Structures, Monterey, California, USA

Paper in proceeding

2003

Substrate Resistance Modelling in One, Two and Three Dimensions

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al

Swedish System-on-Chip Conference, Eskilstuna

Other conference contribution

2003

CMOS large signal model for CAD

Iltcho Angelov, Mattias Ferndahl, Fredrik Ingvarson et al

2003 IEEE MTT-S International Microwave Symposium Digest. Vol. 2, p. 643-646

Paper in proceeding

2003

An Accurate Pi Resistor Network for Substrate Coupling Estimation

Shiva P. Kagganti, Simon Kristiansson, Fredrik Ingvarson et al

21st Norchip Conference, Riga, Latvia

Paper in proceeding

2003

Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model

Fredrik Ingvarson, Martin Linder, Kjell Jeppson

IEEE Transactions on Semiconductor Manufacturing. Vol. 16 (2), p. 228-232

Journal article

2003

90-nm CMOS for microwave power applications

Mattias Ferndahl, Hans-Olof Vickes, Herbert Zirath et al

IEEE Microwave and Wireless Components Letters. Vol. 13 (12), p. 523-525

Journal article

2002

Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model

Fredrik Ingvarson, Martin Linder, Kjell Jeppson

Proceedings of the 2002 IEEE International Conference on Microelectronic Test Structures, p. 71-75

Paper in proceeding

2001

A new test structure for parasitic resistance extraction in bipolar transistors

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al

Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures, p. 25-30

Paper in proceeding

2001

Bipolar Transistor Parameter Extraction, Modeling and Test Structure Design

Fredrik Ingvarson

Doctoral thesis

2001

A procedure for characterizing the BJT base resistance and Early voltages utilizing a dual base transistor test structure

Fredrik Ingvarson, Martin Linder, Kjell Jeppson et al

Proceedings of the 2001 IEEE International Conference on Microelectronic Test Structures, p. 31-36

Paper in proceeding

2000

Extraction of the intrinsic base region sheet resistance in bipolar transistors

Fredrik Ingvarson, Martin Linder, Kjell Jeppson et al

Proceedings of the 2000 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, p. 184-186

Paper in proceeding

2000

On DC modeling of the base resistance in bipolar transistors

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al

Solid-State Electronics. Vol. 44 (8), p. 1411-1418

Journal article

2000

Extraction of emitter and base series resistances of bipolar transistors from a single DC measurement

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al

IEEE Transactions on Semiconductor Manufacturing. Vol. 13 (2), p. 119-126

Journal article

1999

A new procedure for extraction of series resistances for bipolar transistors from DC measurements

Martin Linder, Fredrik Ingvarson, Kjell Jeppson et al

Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures, p. 147-151

Paper in proceeding

1999

Stress and recovery transients in bipolar transistors and MOS structures

Fredrik Ingvarson, Lars-Åke Ragnarsson, Per Lundgren et al

Proceedings of the 1999 IEEE International Conference on Microelectronic Test Structures, p. 173-178

Paper in proceeding

1998

A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

Fredrik Ingvarson, Kjell Jeppson

Proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures, p. 159-164

Paper in proceeding

1998

Parameter extraction for bipolar transistors

Fredrik Ingvarson, Kjell Jeppson

Microelectronic Engineering. Vol. 40 (3-4), p. 187-94

Journal article

1998

Characterisation of bipolar transistors : parameter extraction and degradation dynamics

Fredrik Ingvarson

Licentiate thesis

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