Substrate Resistance Modeling for Noise Coupling Analysis
Paper in proceeding, 2003
Author
Simon Kristiansson
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Shiva P. Kagganti
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
Ewert Tony
Fredrik Ingvarson
Department of Microelectronics and Nanoscience
Olsson Jörgen
Kjell Jeppson
Chalmers, Microtechnology and Nanoscience (MC2), Solid State Electronics
International Conference on Microelectronics Test Structures, Monterey, California, USA
Subject Categories
Electrical Engineering, Electronic Engineering, Information Engineering